Scanning Electron Microscope (SEM) raw data of vermiculite-based composite materials
dc.contributor.author | Chen, Ziwei | |
dc.contributor.author | Su, Yuehong | |
dc.contributor.other | Zhang, Yanan | |
dc.date.accessioned | 2022-03-11T08:52:22Z | |
dc.date.available | 2022-03-11T08:52:22Z | |
dc.date.issued | 2022-03-11 | |
dc.identifier.uri | https://rdmc.nottingham.ac.uk/handle/internal/9496 | |
dc.description.abstract | Scanning Electron Microscope (SEM) photos for vermiculite-based composite materials to visualise the salt inside of the matrix of a composite. The resolution produced is better than one nanometre. This can be used to make sure that the salt is binding uniformly inside the matrix and therefore maximising surface area and potential for mass and heat transfer. | en_UK |
dc.language.iso | en | en_UK |
dc.publisher | The University of Nottingham | en_UK |
dc.rights | CC-BY | * |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | * |
dc.subject.lcsh | Materials -- Analysis | en_UK |
dc.subject.lcsh | Vermiculite | en_UK |
dc.subject.lcsh | Materials -- Microscopy | en_UK |
dc.subject.lcsh | Scanning electron microscopy | en_UK |
dc.subject.lcsh | Composite materials -- Thermal properties | en_UK |
dc.title | Scanning Electron Microscope (SEM) raw data of vermiculite-based composite materials | en_UK |
dc.identifier.doi | http://doi.org/10.17639/nott.7178 | |
dc.subject.free | thermochemical material, material characterisation, Scanning Electron Microscope (SEM) | en_UK |
dc.subject.jacs | Physical sciences::Materials science | en_UK |
dc.subject.lc | T Technology::TA Engineering (General). Civil engineering (General) | en_UK |
dc.date.collection | 2021 | en_UK |
uon.division | University of Nottingham, UK Campus::Faculty of Engineering::Department of Architecture and Built Environment | en_UK |
uon.funder.controlled | Engineering & Physical Sciences Research Council | en_UK |
uon.datatype | Scanning Electron Microscope (SEM) photos | en_UK |
uon.grant | EP/T021233/1 | en_UK |
uon.collectionmethod | Scanning Electron Microscope (SEM) | en_UK |
uon.rightscontact | Yuehong Su | en_UK |
uon.rightscontact | Ziwei Chen | en_UK |
uon.rightscontact | Yanan Zhang | en_UK |
uon.preservation.rarelyaccessed | true | |
uon.identifier.risproject | RIS 2307927 | en_UK |
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