Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy

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Publication date
2019-04-05
Creators
Beton, Peter
Metadata
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Description
Images and related analysis relevant to this research publication.
External URI
DOI
Subjects
  • Thin films
  • Polymers
  • Optoelectronic devices
  • Atomic force microscopy
  • polythiophene, atomic force microscopy, boron nitride
  • Physical sciences::Chemistry::Physical chemistry
  • Physical sciences::Physics::Chemical physics, Solid-state physics
  • Q Science::QD Chemistry::QD450 Physical and theoretical chemistry
  • Q Science::QC Physics::QC170 Atomic physics. Constitution and properties of matter
Divisions
  • University of Nottingham, UK Campus::Faculty of Science::School of Physics and Astronomy
  • University of Nottingham, UK Campus::Faculty of Science::School of Chemistry
Deposit date
2019-04-05
Data type
Images acquired using scanning probe microscopy, analysis programmes
Contributors
  • Summerfield, Alex
  • Korolkov, Vladimir
  • Amabilino, David
  • Murphy, Alanna
Funders
  • Engineering & Physical Sciences Research Council
  • Leverhulme Trust
Grant number
  • EP/P019080/1
  • EP/N033906/1
  • RPG-2016-104
Data collection method
Asylum Cypher Atomic Force Microscope
Resource languages
  • en
Publisher
The University of Nottingham